Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code

Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code

Research Authors
H Eldib, C Wang, M Taha, P Schaumont
Research Department
Electrical Engineering Department
Research Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
Research Member
Mostafa Mohamed Ibrahim Taha
Research Rank
3
Research Year
2015