A Partitioning Technique for Reducing the Computational Complexity of the Test generation and Probabilistic Detection of Faults in Combinational Circuits

A Partitioning Technique for Reducing the Computational Complexity of the Test generation and Probabilistic Detection of Faults in Combinational Circuits

Research Authors
S. A. Ali
Research Department
Electrical Engineering Department
Research Journal
International Journal of Electronics
Research Member
Samia Abd El-Fattah Ali Hassan
Research Pages
pp. 1301-1319
Research Rank
1
Research Vol
Vol. 73, No. 6
Research Year
1992