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97 dB Dynamic Range CMOS Image Sensor Based on Diode Connected Load

Research Abstract
This paper introduces the design and implementation of a wide dynamic range CMOS image sensor (CIS) with high sensitivity. The sensor is designed and implemented in a 130 nm CMOS technology. The pixel occupies an area of 3 µm x 3 µm and consists of six NMOS transistors with one capacitor. The readout circuit features an extremely low output noise of 19 µVrms with a 4 MHz bandwidth. Power dissipation of 11.2 µW was achieved at low voltage operation of 1.6 V. The sensor has a combination of low noise and a 97 dB wide dynamic range due to the diode connected load configuration.
Research Authors
Abeer Elsayed
Mohamed Atef
Mohamed Abdelgawad
Research Department
Research Journal
2019, 36th National Radio Science Conference (NRSC 2019)
Research Member
Mohammed Abd Jawad Mohammed Al Sadd
Research Pages
378-385
Research Publisher
NULL
Research Rank
4
Research Vol
NULL
Research Website
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8734592&isnumber=8734528
Research Year
2019