The fine-scale precipitates, that occurs during aging, the supersaturated Al–1.0 at.% Mg–x at.% Si (x = 0.6, 1.0 and 1.6) alloys have been investigated by differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques. The strength of the alloys increases as a high density of very fine β″ coherent and β′ semicoherent precipitates nucleate. The precipitates compositions have been determined by analyzing the X-ray diffraction (XRD) charts, by using Scherrer equation. The obtained results showed that the β″ and β′ precipitates size lies in the nanometer range (from 5 nm to 32 nm). In addition, increasing Si concentration has exhibited an increase in the density of the precipitates, which fortifies the physical properties.

The fine-scale precipitates, that occurs during aging, the supersaturated Al–1.0 at.% Mg–x at.% Si (x = 0.6, 1.0 and 1.6) alloys have been investigated by differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques. The strength of the alloys increases as a high density of very fine β″ coherent and β′ semicoherent precipitates nucleate. The precipitates compositions have been determined by analyzing the X-ray diffraction (XRD) charts, by using Scherrer equation. The obtained results showed that the β″ and β′ precipitates size lies in the nanometer range (from 5 nm to 32 nm). In addition, increasing Si concentration has exhibited an increase in the density of the precipitates, which fortifies the physical properties.

The fine-scale precipitates, that occurs during aging, the supersaturated Al–1.0 at.% Mg–x at.% Si (x = 0.6, 1.0 and 1.6) alloys have been investigated by differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques. The strength of the alloys increases as a high density of very fine β″ coherent and β′ semicoherent precipitates nucleate. The precipitates compositions have been determined by analyzing the X-ray diffraction (XRD) charts, by using Scherrer equation. The obtained results showed that the β″ and β′ precipitates size lies in the nanometer range (from 5 nm to 32 nm). In addition, increasing Si concentration has exhibited an increase in the density of the precipitates, which fortifies the physical properties.

The fine-scale precipitates, that occurs during aging, the supersaturated Al–1.0 at.% Mg–x at.% Si (x = 0.6, 1.0 and 1.6) alloys have been investigated by differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques. The strength of the alloys increases as a high density of very fine β″ coherent and β′ semicoherent precipitates nucleate. The precipitates compositions have been determined by analyzing the X-ray diffraction (XRD) charts, by using Scherrer equation. The obtained results showed that the β″ and β′ precipitates size lies in the nanometer range (from 5 nm to 32 nm). In addition, increasing Si concentration has exhibited an increase in the density of the precipitates, which fortifies the physical properties.

Both radial and spiral distortion of magnetic lens with the field distribution in the form B(z)αzn are analyzed by means of Scherzer's formula. To estimate the performance of the image in electron microscope the dimensionless quality factors (F.Z. Marai, T. Mulvey, Sherzer's formula and the correction of spiral distortion in the electron microscope, Ultramicroscopy 2 (1977) 187–192.), for both radial and spiral distortion is calculated. The results have been compared with different projector lenses.

A process for deep trench filling by BenzoCycloButene (BCB) polymer is explored. Deep trenches with 100-μm depth and different aspect ratios from 1.4 to 20 have been successfully filled by BCB. Besides, chemical mechanical polishing (CMP) of BCB is studied with the main goals of smoothing surface topography of substrate after BCB filling and removing excess BCB coating which may be necessary in some applications. Removal rate for BCB, V RR, of about 0.24 μm/min has been achieved for hard cured BCB films using acid slurry. After CMP, the BCB layer showed a roughness of about 1.36 nm (Rq, measured by atomic force microscopy, AFM).