Compositioneffectonthestructureandopticalparameters of Ge–Se–Tethinfilms

Compositioneffectonthestructureandopticalparameters
of Ge–Se–Tethinfilms

Research Abstract
ThepresentworkreportedtheinfluenceofGecontentvariationontheopticalpropertiesof GexSe50Te50-x (x¼0, 5,15,20,35at%).Vacuumthermalevaporationtechniquewas employedtoprepareamorphousGexSe50Te50x thinfilms.Thestoichiometryofthe chemicalcompositionwascheckedbyenergydispersiveX-rayspectroscopy(EDX),whereas thethinfilmsstructurewasdeterminedbyanX-raydiffractionandascanningelectron microscope(SEM).Theopticalabsorptionmeasurementswereperformedatroom temperatureinthewavelengthrangeof200–900nm.Manyopticalconstantswere calculatedforthestudiedthinfilmsutilizingtheopticalabsorptiondata.Itwasobserved thattheopticalabsorptionmechanismfollowstheruleofthealloweddirecttransition.The opticalbandgapwasfoundtoincreasefrom2.31to2.60eVastheGecontentincreases from0to35at%.Thisresultwasexplainedintermsofthechemicalbondapproach.
Research Authors
M. Mohamed , M.A.Abdel-Rahim
Research Department
Department of physics
Research Journal
Materials Science in Semiconductor Processing
Research Member
Mansour Abdel Sattar Sayed Mohamed
Research Pages
PP.288–292
Research Rank
1
Research Vol
Vol.27
Research Year
2014