Glassy As45.2Te46.6In8.2 thin films were thermally evaporated onto chemically cleaned glass substrates. Crystallization kinetics were determined under isothermal conditions. Heating the film up to the isothermal temperature with different rates was found to yield films with different electrical characterization. Conductivity of the investigated film was used as a parameter indicating the crystallized fraction χ(t). The obtained values of the activation energy for crystallization, the frequency factor and the Avrami index are (100±0.5) kJ/mol, (7.31±0.04) 108 s−1 and 1.45, respectively. The non-integer value of the Avrami index indicates that two crystallization mechanisms are responsible for the crystal growth

Glassy As45.2Te46.6In8.2 thin films were thermally evaporated onto chemically cleaned glass substrates. Crystallization kinetics were determined under isothermal conditions. Heating the film up to the isothermal temperature with different rates was found to yield films with different electrical characterization. Conductivity of the investigated film was used as a parameter indicating the crystallized fraction χ(t). The obtained values of the activation energy for crystallization, the frequency factor and the Avrami index are (100±0.5) kJ/mol, (7.31±0.04) 108 s−1 and 1.45, respectively. The non-integer value of the Avrami index indicates that two crystallization mechanisms are responsible for the crystal growth

Measurements of absorbance and transmittance in Ge20Se80-xBix (0 x 10 at %) chalcogenide thin films in the visible range at room temperature were carried out. The dependence of the optical absorption on the photon energy is described by the relation hv=B(hv-E0)2. It was found that the optical energy gap E0 decreases gradually from 1.93 to 1.205 eV with increasing Bi content up to 10 at %. The rate of the change decreases with increasing Bi content. The composition dependence of the optical energy gap is discussed on the basis of the concentration of covalent bonds formed in the chalcogenide film. The decrease of optical energy gap with increasing Bi content is related to the increase of Bi–Se bonds and the decrease of Se-Se bonds. The effect of thermal annealing for different periods of time on the behavior of optical absorption of the as-deposited films was investigated. The optical gap increases with increasing annealing time. The rate of change decreases with increasing annealing time, then E0 reaches a steady state. The increase in the values of the optical gap of the amorphous films with heat treatment is interpreted in terms of the density of states model. The structure of the as-prepared and thermally annealed films were investigated using transmission electron microscopy, energy dispersive analysis and X-ray diffraction. It was confirmed that the as-prepared films were in the amorphous state. Phase separation was observed after thermal annealing. The separated crystalline phases were identified.

The microstructure of electron beam deposited Bi3Se100 thin films (where x varies from 0 to 16 at.%) was investigated. The morphology of crystallization for in situ thermally annealed and electron beam heated Bi16Se84 films was investigated using transmission electron microscopy. Selected area electron diffraction was used to characterize different phases observed during the crystallization process where the crystalline Bi2Se3 phase was separated. Optical absorption measurements were carried out on as-deposited BixSe100-x films of different compositions. It was found that the mechanism of the optical absorption follows the rule of non-direct transition. The optical energy gap decreases with increasing Bi content. The effect of thermal annealing on the optical properties of Bi16Se84 films was investigated. The study indicated that Bi16Se84 films have low threshold energy for amorphization, high optical absorption coefficient and optimum contrast between the amorphous and the crystalline states. The decrease in the optical gap is discussed on the basis of amorphous-crystalline transformations

Thermal co-evaporation technique (from two sources — Cu wire and In30Se70 ingots) was used to prepare CuInSe thin films. Controlling the evaporation rates from the sources was helpful to get films having different Cu/In content. The temperature dependence of the electrical conductivity was investigated in the temperature range 80 K≤T≤435 K. The density of localized states at the Fermi level and the activation energy for conduction are decreased on increasing the film (Cu/In) content. The activation energy for conduction of the Cu20In20Se60 film decreases on increasing the annealing temperature. Tetragonal CuInSe2 and hexagonal Cu2Se crystalline phases resulting from heat treatment have been identified using X-ray diffractometry and transmission electron microscope

As30Te70−xGax (x=0.5, 1, 3, 6 and 10 at.%) chalcogenide thin films were studied. Specimens of thickness 2500 Å were used for resistivity (ρ) measurements as a function of temperature (T) in the temperature range from 300 to 443 K. The resistivity (ρ) exhibits an activated temperature dependence in accordance with the relation ρ(T)=ρ0 exp(ΔE/kT). It was found that the activation energy for conduction (ΔE) and room temperature resistivity (ρ300) decrease with increasing Ga content up to 3 at.%. For x greater than 3 at.%, it was found that ΔE and ρ300 increase with increasing Ga content. The results were discussed according to the valence alternation pair (VAP) model and the alloying effect. Thermal annealing above Tg was found to decrease ρ and ΔE. The decrease of ρ and ΔE after annealing at T>Tg was attributed to the amorphous–crystalline transformation. XRD, SAED, TEM and DSC were used to study the structure of the as-deposited and annealed films

Results of differential scanning calorimetric (DSC) under non-isothermal conditions on three compositions of GexSe92-xIn8 (x = 10, 12.5 and 15 at%)) are reported and discussed. It is seen that these glasses exhibit a double glass transition and single-stage crystallization on heating. The glass transition temperature (Tg), the onset crystallization temperature (Tc) and the peak temperature of the crystallization (Tp) were found to be dependent on the composition and the heating rates. The activation energy for glass transition (Eg) and for crystallization (Ec) are evaluated and their composition dependence is discussed. The crystallization phases resulting from the DSC have been identified using X-ray diffraction and scanning electron microscopy (SEM). The results indicated that the crystallization mechanism occurs in one, two and three dimensional growth according to Avrami exponents (n). The kinetic parameters determined have made it possible to discuss the glass-forming ability

X-ray scattering has been used to investigate the structure of glassy As2Te3, prepared by quenching in liquid nitrogen. The result of the coherent scattered x-ray intensity proved that the medium-range order (MRO) is very weak, and this was attributed to the higher metallic nature of the glass. Analysis of the first two peaks in the curve of the total radial distribution function, T(r), revealed that the short-range order (SRO) in the glassy state is different from that in the crystalline state, and that the first coordination sphere includes As–As and Te–Te bonds in addition to the As–Te bonds

In this study, amorphous chalcogenide Cu10Se90 and Cu20Se80 thin films have been obtained by thermal evaporation deposition process on well-cleaned quartz substrates. Thin films were annealed at various temperatures in N2 atmosphere. X-ray diffraction patterns (XRD) showed that the films are like amorphous in nature for as prepared but annealed films produced crystalline peaks and that their crystallinity was proportional to annealing temperature. Thin film morphologies were examined using scanning electron microscopy (SEM). The optical absorption coefficient (α) for the as-deposited and annealed films was calculated using spectrophotometer measurements of the transmittance (T) and reflectance (R) at normal incidence of light in the wavelength range 200–2500 nm. The optical band gap (Eg) was found to be around 2.281 and 2.231 eV for as-prepared Cu10Se90 and Cu20Se80 thin films respectively, (Eg) showed a decrease with increasing of the annealing temperature higher than the glass transition temperature (Tg). The high frequency dielectric constant (ε∞) and the ratios of the carrier concentration to the effective mass (N/m*) were also determined for the as-deposited and annealed films. The dispersion of the refractive index is discussed in terms of the single-oscillator model. The oscillator energy Eo and the dispersion energy Ed were obtained. The results are discussed and correlated in terms of amorphous–crystalline transformations

In this study, amorphous chalcogenide Cu10Se90 and Cu20Se80 thin films have been obtained by thermal evaporation deposition process on well-cleaned quartz substrates. Thin films were annealed at various temperatures in N2 atmosphere. X-ray diffraction patterns (XRD) showed that the films are like amorphous in nature for as prepared but annealed films produced crystalline peaks and that their crystallinity was proportional to annealing temperature. Thin film morphologies were examined using scanning electron microscopy (SEM). The optical absorption coefficient (α) for the as-deposited and annealed films was calculated using spectrophotometer measurements of the transmittance (T) and reflectance (R) at normal incidence of light in the wavelength range 200–2500 nm. The optical band gap (Eg) was found to be around 2.281 and 2.231 eV for as-prepared Cu10Se90 and Cu20Se80 thin films respectively, (Eg) showed a decrease with increasing of the annealing temperature higher than the glass transition temperature (Tg). The high frequency dielectric constant (ε∞) and the ratios of the carrier concentration to the effective mass (N/m*) were also determined for the as-deposited and annealed films. The dispersion of the refractive index is discussed in terms of the single-oscillator model. The oscillator energy Eo and the dispersion energy Ed were obtained. The results are discussed and correlated in terms of amorphous–crystalline transformations