Bayesian approach to prediction with outliers from the Burr type X model.

Bayesian approach to prediction with outliers from the
Burr type X model.

Research Authors
Jaheen, Z.F.
Research Department
Department of Mathematics
Research Journal
Microelectronics and Reliability
Research Member
Zeinhom Fekri Jaheen Radwan
Research Pages
703- 705
Research Rank
1
Research Vol
Vol. 35, No. 4
Research Year
1995