Repair techniques for aged TSVs in 3D integrated circuits

Repair techniques for aged TSVs in 3D integrated circuits

Research Abstract
NULL
Research Authors
Siroos Madani, Kasem Khalil, Bappaditya Dey, Devante Bonton, Magdy Bayoumi
Research Department
Electrical Engineering Department
Research Journal
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
Research Member
Kasem Mohamed Ahmed Khalil
Research Pages
53-58
Research Publisher
IEEE
Research Rank
3
Research Vol
NULL
Research Website
NULL
Research Year
2017