Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits | Faculty of Engineering

Faculty of Engineering

Research Authors

S. A. Ali and G. R. Redinbo

Research Department

Electrical Engineering Department

Research Journal

IEEE Trans. On Computers

Research Member

Samia Abd El-Fattah Ali Hassan

Research Pages

pp. 1426-1428.

Research Rank

1

Research Vol

Vol. 43, No. 12

Research Year

1994